sickness exam and chip test

[ref]
https://imgur.com/vxPbMRl

https://www.ptt.cc/bbs/Gossiping/M.1585593748.A.8FC.html

https://books.google.com.tw/books?id=biu_BAAAQBAJ&pg=PA70&lpg=PA70&dq=chip+test+overkill+rate&source=bl&ots=XIV-nEMKA1&sig=ACfU3U00ecNSFwuN8cLqjfO0tUxiQvQrbg&hl=zh-TW&sa=X&ved=2ahUKEwjJmvTCxMPoAhVyxYsBHfnHDqoQ6AEwAXoECAsQLQ#v=onepage&q=chip%20test%20overkill%20rate&f=false

疾病檢測跟晶片檢測有相似之處

樣本空間: 所有待測人/晶片

生病的人/生產不良的晶片

做一個檢驗, 驗出相信是生病的人/壞掉晶片

兩個圈圈會切出四個區域

醫學領域:

盛行率prevalance: p=(a+b)/(a+b+c+d)

敏感度sensitivity, sen= a/(a+b)

特異度specificity, spe= d/(c+d)

陽性預測值, PPV = a/(a+c)

陰性預測值, NPV = d/(b+d)

晶片領域:

配合[ref]1定義, 

b 為誤放, 要準備面對面訴及返修成本提高或賠償, 

c為誤砍 (overkill) 晶片業的大忌, 面對報廢品增多/成本提高

盛行率 <-> 全部晶片裡壞掉的比例

敏感度 <-> 壞晶片裡, 驗出為壞掉的比例

特異度<-> 好晶片裡, 驗出為好的晶片

陽性預測值 <-> 測試宣告為壞的晶片裡, 真的壞掉的比例

陰性預測值 <-> 測試宣告為好的晶片裡, 壞掉的機率

Cadence: default environment setting

ref. https://community.cadence.com/cadence_technology_forums/f/custom-ic-design/24143/default-font-size-for-virtuoso-visualization-analysis

>> vi ~/.cdsenv
   ; define output waveform format
   spectre.outputs simOutputFormat string "psfbin"
   ; define undo step counts
   ui undoLevel int 10
   ; do not show what's new window
   ddserv  showWhatsNew    string  "no"
   layout  showWhatsNew    string  "no"
   asimenv showWhatsNew string "no"
   asimenv showWhatsNew string "5.1.0"
   ; update CDF property automatically
   auCore.misc updateCDFtermOrder boolean t
   ;set default font
   viva.axis font string "Default,16,-1,5,:50,0,0,0,0,0"

[CIW font]
CIW -> options -> fonts -> CIW: uncheck "use text font" adjust by your like